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Elena Georgieva, Associate Research Scientist


GEST Research Group:

AETD

GSFC Code:

554.0

Mailing Address:

AETD
Building 19, Room S31
NASA GSFC, Code 554.0
Greenbelt, MD 20771 USA

Elena Georgieva

Phone:

(301) 286-9344

Fax:

(301) 286-1750

Email:

elena.m.georgieva@nasa.gov

Most Recent Publication

Wilson E.L., Georgieva E.M., Heaps W.S., 2007. Development of a Fabry-Perot interferometer for ultra-precise measurements of column CO2 , Meas. Sci. Technology, 18, 1495-1502.

Research Interests:

My primary research interests are connected with the development of active and passive sensors for remote sensing applications. I am involved in all aspects of instrument build, laboratory, field and airborne tests to better understand the greenhouse processes in the atmosphere.

Biography:

Dr. Elena M. Georgieva received her PhD in physics in 1998 from the University of Sofia. She was a research associate at Lasers and Optical characterization Laboratory, Georgetown University where she worked on nanoparticles characterization and correlation spectroscopy (01/2000 - 08/2001). Georgieva also was a research associate at NIST Center for neutron research and Johns Hopkins University (08/2001 - 07/2002). For four years she was a Senior Systems Scientist/Engineer at Science systems and Applications and worked at Goddard Laser and Electro-optics branch on instrument development for measurement of atmospheric species (7/2002-05/2006). She has research experience in remote sensing, data analysis and validation, instrument development, spectroscopy, interferometry,3-D imaging laser radar system and polarimetry. Previous positions held by Georgieva include Assistant Professor at the Institute of Applied Physics, Technical University of Sofia; Bulgaria (1995 - 1999); Graduate Research Assistant, Department of Physics, University of Sofia (1988 - 1994); Research Associate, Institute of Applied Mineralogy, Bulgarian Academy of Sciences, Sofia (1987 - 1988). She has 28 refereed publications and is a member of Optical Society of America and The International Society for Optical Engineering (SPIE).